Poster Fri, Sep 11, 2026 • 7:00 AM – 9:00 AM PDT ExHall # 333

High-Throughput Event-Based Feature Detection and Tracking on an Embedded CPU

Ethan Elms ⋅ Yasir Latif ⋅ Tat-Jun Chin

Keywords: Recognition, Tracking, Re-ID & Anomaly Detection